Remedies of Short Channel Effects in Conventional MOSFET - A parameter modeling study

by De, Swapnadip
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De, Swapnadip Remedies of Short Channel Effects in Conventional MOSFET - A parameter modeling study
De, Swapnadip - Remedies of Short Channel Effects in Conventional MOSFET - A parameter modeling study

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Description

MOSFETs are scaled primarily due to increased packing density and speed. Due to scaling some drawbacks are found in conventional MOSFET. They are mobility degradation and surface scattering, velocity saturation in MOSFET, avalanche breakdown, hot electron effect, drain induced barrier lowering(DIBL), reduction of threshold voltage, punch through. These drawbacks are known as Short Channel Effect(SCE).The model of double halo dual material gate combines the advantages of both the channel engineering (halo) and the gate engineering techniques (dual-material gate) to effectively suppress the short-channel effects (SCEs). The model is derived using the pseudo-2D analysis by applying the Gauss's law to an elementary rectangular box in the channel depletion region, considering the surface potential variation with the channel depletion layer depth.

Contributors

Author:
De, Swapnadip
Das, Debarati
Sarkar, Chandan Kumar

Further information

Biography Artist:
Dr. Swapnadip De is working as Asst. Professor in ECE Department of Meghnad Saha Institute of Technology for the last 12 years. He obtained his PhD degree from Jadavpur University under the guidance of Prof. C.K.Sarkar. He is a member of IEEE EDS and Communications Society. He is also the Editor of Inderscience Publications.
Language:
Englisch
Number of Pages:
76
Media Type:
Taschenbuch
Publisher:
LAP Lambert Academic Publishing

Master Data

Product Type:
Paperback book
Release date:
01 July 2014
Package Dimensions:
0.22 x 0.15 x 0.005 m; 0.159 kg
GTIN:
09783659566264
DUIN:
FOJHKFHPTFH
£27.99
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